Services

ACE FIB TEM Lamella  CIRCUIT EDIT
services
High Resolution SEM imaging | TEM sample preparation
Our Analytical Services
Quality work you can depend on!


ACE Analytical Services

Technical Partnership | 5nm Backside Edit | Titan STEM-EELS

Advanced Node Engineering: Atomic-Scale Analysis & Surgical Circuit Edit

Providing industry-leading analytical solutions since 2004, Advanced Circuit Engineers (ACE) operates as a dedicated technical partner for the semiconductor and advanced materials industries. We provide the mastery and precision required for Complex Backside FIB Circuit Edit at the 5nm FinFET node, including specialized support for unique Full 300mm Wafer FIB projects.

Our approach is rooted in collaborative engineering and high-fidelity data. Beyond circuit modification, our laboratory serves as a premier destination for comprehensive Material Analysis. By leveraging Titan-class Probe-Corrected STEM and STEM-EELS compositional mapping, we deliver the sub-nanometer clarity and chemical quantification needed to solve the most complex structural challenges across the most demanding technology sectors.

Engineering Partnership

  • Consultative Technical Support
  • Backside Sample Prep
  • Site-Specific FIB Cross-Sections
  • Pre-Edit GDS-II Consultation
  • Rapid Technical Turnaround

Material Analysis

  • Titan Probe-Corrected STEM
  • Sub-Ångström Atomic Resolution
  • STEM-EELS Chemical Mapping
  • Atomic-Column Elemental Analysis
  • High-Yield TEM Lamella Prep

Complex Circuit Edit

  • 5nm Node Backside Navigation
  • Full 300mm Wafer Compatibility
  • Complex Multi-Level Edits
  • High-Aspect Ratio Trenching
  • In-Situ Layout Validation