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FIB Cross-Section | High-Resolution SEM imaging | TEM Sample Preparation | EDS analysis | FIB nano-machiningDual-Beam FIB-SEM ServicesADVANCED CIRCUIT ENGINEERS, LLC.
Utilizing the Nanolab 660 Dual-Beam (FIB-SEM), ACE offers a full line of applications ranging from: TEM Lamella Sample Preparation service, Failure analysis Cross-Sections, High resolution SEM imaging, nano-machining, STEM and EDX analysis.