TEM

TEM | Transmission Electron Microscopy

FEI Titan 80kV-300kV TEM/STEM

Aberration-Corrected Atomic Resolution TEM Imaging

FEI TITAN Probe-Corrected TEM-STEM imaging services.  Transmission Electron Microscopy (TEM) is an advanced analytical field emission electron microscope capable of atomic-level imaging and analysis of various types of materials.

With the operation for imaging, diffraction, and elemental analysis, TEM has demonstrated its wide usage in material development and device failure analysis, including multi-layer interfaces, quantum wells, dislocations, and compositional mapping.

High angle annular dark field (HAADF) images in STEM mode are strongly dependent on the average atomic number (Z-contrast) and are not strongly affected by dynamical diffraction effects or by sample thickness variations.

Competitively priced

  • Discounts for volume work
  • No “rush-surcharge” expedite fees
  • Quick turn-around

Results

  • Sub-Å resolution in probe-corrected STEM mode
  • Large area windowless EDS detector (0.45sr)
  • EELS quantification and mapping
  • Tomography and holography
  • 80, 200, 300kV accelerating voltages

Onsite Collaboration

  • Feel free to stop by and work with our analyst on your project

FEI TITAN TEM/STEM

TEM | Transmission Electron Microscopy

System configuration and capabilities

  • Acceleration voltage range: 80kV to 300kV

  • Sub-Å resolution in probe-corrected STEM mode

  • EELS quantification and mapping

  • Tomography and holography

  • Large area windowless EDS detector (0.45sr)

TEM Gallery