FEI Titan 80kV-300kV TEM/STEM
Aberration-Corrected Atomic Resolution TEM Imaging
FEI TITAN Probe-Corrected TEM-STEM analytical services. Transmission Electron Microscopy (TEM) is an advanced analytical field emission electron microscope capable of atomic-level imaging and analysis of various types of materials.
With the option for atomic imaging, diffraction, doping, elemental EELS and EDX analysis, TEM has demonstrated its wide usage in material development. TEM is also utilized for device failure analysis, including multi-layer interfaces, quantum wells, dislocations, and compositional mapping.
High angle annular dark field (HAADF) images in STEM mode are strongly dependent on the average atomic number (Z-contrast) and are not strongly affected by dynamical diffraction effects or by sample thickness variations.