Atomic-Scale Characterization &
Nano-Scale Circuit Engineering
Advanced Circuit Engineers (ACE) provides the critical analytical feedback and precision engineering required for the industry’s most demanding technology nodes.
From sub-angstrom STEM imaging for materials characterization to precision 5nm FIB Circuit Edit for device validation, we deliver high-integrity data for next-generation R&D. We serve as a strategic partner to the world’s leading foundries and fabless semiconductor companies since 2004.
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Nanoscale Engineering
FIB Circuit Edit: Specialized front-side and back-side modifications and nano-machining for 5nm architectures and beyond. -
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Metrology & Characterization
Atomic-Resolution STEM: Probe-corrected imaging providing sub-angstrom structural validation for advanced materials and structural analysis. -
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Chemical Analysis
Spectroscopy: High-sensitivity EELS and EDS for precise elemental quantification and nanoscale chemical mapping. -
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Precision Specimen Prep
TEM Lamella & Cross-Sections: High-yield, site-specific preparation using advanced Dual-Beam FIB systems. -
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Surface Science
High-Resolution SEM: Specialized characterization and quantitative EDS surface analysis for defect and morphology inspection.



