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FIB Circuit Edit | Dual-Beam | FIB Cross section | TEM service lab - ACE

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Established in 2004, Advanced Circuit Engineers provides the highest level of expertise in the industry performing atomic resolution TEM-STEM imaging, EELS-EDX, SEM, Dual-Beam FIB cross-section / TEM lamella sample preparation and FIB Circuit Edit services down to 5 nm!

 

About Us

ACE provides advanced failure analysis and microscopy analytical services that include Semiconductors, IP and litigation analysis, Automotive, Ceramics, Photonics, Glass, Batteries, Biotech & Medical, MEMS, Electrolytic-Electroless Microvia, solar LED, CdTe, CIGS, multi-junction, perovskite, infrared photodetectors, waveguides and AI.

We know how critical a quick turnaround can be for our clients, without compromising on quality or charging “expedite fees”. We provide local pickup and drop-off services, and we invite our clients to work directly with our operators during sessions. Call or email to learn how we can help you get the results you need.

FIB STEM TEM EDS EELS

CULTURE OF EXCELLENCE

We are comprised of highly specialized engineers who are technical experts in there individual disciplines.  Our engineers utilize knowledge driven methodologies and innovative techniques to provide the best solutions for our clients.

INDUSTRIES SERVED:

ACE provides advanced failure analysis and microscopy services to: Semiconductors, IP & litigation analysis, Automotive, Ceramics, Photonics, Glass, Batteries, Biotech & Medical, MEMS, solar and AI.

CARE AND COMMITMENT

We care for and are committed to our client’s success. Willing to go to the mile, to do what it takes to meet our clients needs and exceed expectation with every engagement.

FAST TURN-A-ROUND

Strongly committed to customer satisfaction, we consistently go the extra mile as we strive to be the “go-to” FIB , SEM, TEM laboratory for emergency request.  Same day service, next business day and weekend service without any additional expedite fees.

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Contact us for a free estimate!

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