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FIB: circuit edit

Ebeam probing






ACE utilizes the state of the art Credence OptiFIB™, Credence IDS P3X™ FIB capable of the following.

  • Circuit Modifications
  • Packaged devices and bare die
  • Wafer edit capability through 200mm
  • 45nm Copper and Copper on low K
  • Probe point creation for mechanical or e-beam probing
  • FIB CAD navigation capability for increased accuracy and efficiency
ACE offers the following services:
  • Basic and advanced FIB applications training classes
  • GDSII CAD processing
  • Device de-capping and FIB layer de-processing measurements
  • Technical reports
  • Competitive rates and special pricing for large orders
  • Offer 24/7 services at no extra charge


Phone: 408 719 1617     Fax: 408-719-1278     Address: 316 S. Abbott Ave, Milpitas Ca 95035